#Atomic Force #Microscopy provides a 3D structure of the surface in nano scale which is less than 10nm. The tip of the AFM touches the #surface and records the small #force between the #probe and the surface
#Scanning $electron $microscope is a microscope that works by scanning a focused beam of $electrons on a sample of $interest. The $high-resolution and three-#dimensional $images produced by SEM provide #morphological, compositional, and $topographical $information
#Kelvin probe force #microscopy is an atomic force microscopy based technique that is used to #measure contact #potential difference between the probe and the #sample. It enables high #resolution surface potential and #topography mapping of a variety of sample