LayTec: Provider of in-situ and in-line optical metrology systems for thin-film processes (compound semiconductors, photovoltaic, oxide and organic deposition).
MEMBER NEWS: In his talk at the Graphene Conference, Marcello Binetti showed how LayTec’s in-situ #metrology allows to characterize the evolution of 2D layers in-situ, during the actual deposition. You can access the PDF here: https://t.co/YnhHi9vedD #EPICmembernews#photonics
We are happy to be on the road again! This week we're in Paris, France for ECSCRM - The 13th European Conference on Silicon Carbide and Related Materials, from October 24th to 28th.
https://t.co/LRjZHVgZFK
🗓️ The online nanoGe Fall Meeting #NFM21 will be taking place in October (18th to 22nd)
Join now with the early registration fee and sign up for a unique series of symposia on topics such as #RenewableEnergy, #QuantumDots, #Bioimaging and many more!
🔗https://t.co/Ofy2fZXb91
CALL FOR PAPERS for LayTec's web-broadcasted in-situ seminar on 5th October!
More info vial LinkedIn:
https://t.co/RCm6JdW6Um
#metrology#in_situ#semiconductors#laytec
We'd like to thank everyone for participating in the #PHOTONICS+ Virtual Exhibition and Conference!
Joachim Rest‘s talk on „In-situ and ex-situ #metrology for VCSEL production“ is now also available on YouTube. Check it out here:
https://t.co/Gz3OZfirRO