Victor Soltwisch

head of working group EUV nano metrology - BESSYII & Metrology Light Source - german national metrology institute - private tweeter

[Victor Soltwisch @VSoltwisch]

New Database Record
Ru n&k from 8.0 nm - 23.75 nm
https://t.co/umob12GLDH

Time-frequency analysis assisted determination of ruthenium optical constants in the sub-EUV spectral range 8 nm – 23.75 nm
Qais Saadeh et al. 2021
https://t.co/42OJL6V07o

[Victor Soltwisch @VSoltwisch]

New Database Record in the OCDB
Ta n&k from 5 nm - 24 nm
https://t.co/umob12GLDH

"Nested Sampling aided determination of tantalum optical constants in the EUV spectral range"
Qais Saadeh et al. 2022
https://t.co/JAWTCkfDa1

[Victor Soltwisch @VSoltwisch]

Registration for QUNOM 2023 is now open!

I am pleased to announce that this year the workshop on Quantification of uncertainties for nano-metrology (QUNOM 2023) will be hosted by UT, and registration is now open.
https://t.co/Q4fk6R6mZP

https://t.co/OigjF7vhEx

[PTB-SR @ptb_sr]

"Nanoscale grating characterization using EUV scatterometry and soft x-ray scattering with plasma and synchrotron radiation" by our PTB Berlin and Aachen colleagues available now in Applied Optics Vol. 62, Issue 1, pp. 117-132 (2023) https://t.co/baVjn1yzYF

[PTB-SR @ptb_sr]

The paper "A new sample chamber for hybrid detection of scattering and fluorescence, using synchrotron radiation in the soft x-ray and extreme ultraviolet (EUV) spectral range" is available now in Review of Scientific Instruments 94, 013904 (2023); https://t.co/8dTZLWsF1P

[Victor Soltwisch @VSoltwisch]

New Database records on the OCDB
Co, TaCo EUV spectral range
https://t.co/AMb51hKUlA

[Victor Soltwisch @VSoltwisch]

New position available in PTB's EUV nanometrology team. We are looking for a talented RSE developer. #jobopportunity #Xray #Berlin
https://t.co/vpaCjcPW7x

[Victor Soltwisch @VSoltwisch]

@MikaPfluger @PIK_Climate Contract limited to 1 year? Good luck :) #fachkraeftemangel

[Victor Soltwisch @VSoltwisch]

Hope to see you soon at the QUNOM meeting in Berlin. Save the date

[Victor Soltwisch @VSoltwisch]

Wir suchen dringend einen zusätzlichen PostDoc für unsere PTB EUV-nanometrology Gruppe in Berlin. Wir bieten Spaß im sub nm Bereich mit einer der schönsten soft X-ray Lampen der Welt. Wenn computational physics auch kein Fremdwort ist, bewirb dich unter
https://t.co/sfrmTA2TcA

[PTB-SR @ptb_sr]

Our colleagues A. Fernandez Herrero, F. Scholze, G. Dai, @VSoltwisch published on Analysis of Line-Edge Roughness Using #EUV #Scatterometry in Nanomanufacturing and #Metrology 164 (2022)
https://t.co/dwpDdgHe2j https://t.co/I6xfXuTQM6

[Victor Soltwisch @VSoltwisch]

It looks better like this. Clear or?

[Victor Soltwisch @VSoltwisch]

DO NOT move the sample during the measurement. "But it looks so pretty!"Latest results from our new HybRef EUV setup.
Thanks to R. Ciesielski & L. Lohr

[imec @imec_int]

#pressrelease
At #SPIElitho 2022, @imec_int presents significant progress in preparing the High-NA #patterning ecosystem for the imec-@ASMLcompany high-NA lab, which will be centered around the first 0.55NA extreme #ultraviolet #lithography prototype tool. https://t.co/tMeV170Tcg

[Victor Soltwisch @VSoltwisch]

This year, the QUNOM meeting will be held in Berlin on June 14 and 15, 2022. The deadline for abstract submission is May 15, 2022.
Hope to see you there

https://t.co/lz9H1Wlezt

[Victor Soltwisch @VSoltwisch]

Nice publication by my colleague Philipp Hönicke on grazing exit X-ray fluorescence (GEXRF) methods for the characterization of nano structures. Great Potential
https://t.co/xwkK7QFdQm

[Victor Soltwisch @VSoltwisch]

Probing molecular interactions of antimicrobial peptides. The Metrology Light Source, the electron storage ring of PTB, is a broad-band source that is well-suited for its implementation in the THz spectral window.
https://t.co/AdLXR83Cv3

[Victor Soltwisch @VSoltwisch]

Talented engineers required for the EUV radiometry group in Berlin-Adlershof
https://t.co/exKOnjYeoi

[George Cutsail @cutsail_lab]

Wait!👋 Now time for deep dive into copper electronic structure by X-ray absorption and emission. Fantastic work by @BlaiseGoog now online in @J_A_C_S. Spoiler Alert🚨 [Cu(CF3)4]- is Cu(III). Great collab @mpicec_press @uniGoettingen @HZB_BESSY @SSRLnews https://t.co/POczvkkKZp

[Victor Soltwisch @VSoltwisch]

Advanced Traceable Metrology for Optical Constants

The industry make increasing use of materials and complex nanostructures. This project addresses the development of metrology to characterize these materials https://t.co/xLkmYiDsQk