EXSA is pleased to announce that André Wählisch from the PTB in Berlin, Germany, was awarded the EXSA Young Scientist Award PhD level of 2024 for his work entitled “Development and validation of novel X-ray spectrometric methods”.
https://t.co/OsApudnNrA
Wir bieten eine PostDocStelle für die Entwicklung und Erforschung einer nanophotonischen chemischen Analysemethode, um eine ultrahohe Nachweisempfindlichkeit im Spektralbereich von THz bis zum mittleren Infrarot zu erreichen. https://t.co/JFun03tbmK
Please find at https://t.co/BmyJWuDtNm the paper on Quantitative reconstruction of atomic orbital densities of neon from partial cross sections published by our colleagues and their project partners.
Wir suchen Ingenieure, die uns bei der Weiterentwicklung unserer Messtechnik und den Messungen für unsere Partner aus der Halbleiterindustrie unterstützen. Bewirb' Dich jetzt! https://t.co/L23fVJLK27
@LNDWBerlin Don't miss to join us and our colleagues tomorrow evening during the long night of science.
Nicht vergessen, uns morgen Abend bei der Langen Nacht der Wissenschaften #LNdW in Charlottenbuch zu besuchen!
You can meet our EUV Team @LNDWBerlin at PTB's historical site in Berlin Charlottenburg.
We are looking forward to meet you there!
https://t.co/DJanROyfYZ
Our EUV Groups are looking for looking for engineers and designers to strengthen the team.
Please find further information at https://t.co/13MaFsYRLE and https://t.co/g92IGcGo7y
Developing Quantitative Nondestructive Characterization of Nanomaterials: A Case Study on Sequential Infiltration Synthesis of Block Copolymers by Eleonora Cara et al. is available now at https://t.co/duIPoDR3hn
Registration for QUNOM 2023 is now open!
I am pleased to announce that this year the workshop on Quantification of uncertainties for nano-metrology (QUNOM 2023) will be hosted by UT, and registration is now open.
https://t.co/Q4fk6R6mZP
https://t.co/OigjF7vhEx
With their partners within the nPSize EMPIR project our colleagues contributed to a nanomaterials publication on Metrological Protocols for Reaching Reliable and SI-Traceable Size Results for Multi-Modal and Complexly Shaped Reference Nanoparticles https://t.co/NLBDWnUSCx
industrial applications of EUV radiation for lithography and measurement technology to developments for space-based VUV and EUV spectroscopy and the investigation of nanostructured surfaces. https://t.co/bQjKXM6yRW Berlin, November 14/15, 2023
This year we invite you again to our seminar on VUV and #EUV metrology, the seventh in a series launched in 2011. We provide a forum for interdisciplinary exchange between basic and technology-oriented researchers and industrial users. The topics cover the latest results from
"Nanoscale grating characterization using EUV scatterometry and soft x-ray scattering with plasma and synchrotron radiation" by our PTB Berlin and Aachen colleagues available now in Applied Optics Vol. 62, Issue 1, pp. 117-132 (2023) https://t.co/baVjn1yzYF
The paper "A new sample chamber for hybrid detection of scattering and fluorescence, using synchrotron radiation in the soft x-ray and extreme ultraviolet (EUV) spectral range" is available now in Review of Scientific Instruments 94, 013904 (2023); https://t.co/8dTZLWsF1P
Our colleagues published an article on Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces. https://t.co/2uDcnnCAGb
New #research published by @EXSA_hu member on Challenges of grazing emission X-ray fluorescence (GEXRF) for the characterization of advanced nanostructured surfaces by Dieter Skroblin, Analía Fernández Herrero, Thomas Siefke, Konstantin Nikolaev, Anna Andrle, 1/2